Materials/Thin Films

The profilometer uses a 2 micron stylus to measure step heights and average surface/RMS roughness.  It’s 3-D capabilities can be used to map features.

The white light interferometer is a fast, nondestructive method for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with dimensions ranging from < 1 nm up to 10000 µm. (See photo right)

With 150 mm X-Y stages and an adjustable height clearance of up to 200mm, the ST400 is ideal for a wide range of samples with varied geometries. With the optical video zoom, high magnification microscopy work can be done in combination with measuring roughness and other properties at precisely selected locations. The advanced software makes it easy to select zones on the video to be scanned automatically by Profilometer. Quality control options are available to automate various aspects of testing including image pattern recognition, database communications, macros for automatic testing and analysis recipes.


 The PB1000 housed in the MORE Center is equipped with both microhardness indenter (0-40N load cell) and Optical Profilometer modules on a single system providing the widest load and most accurate testing capabilities available. Equipped with automated 200mm x 150mm XY motorized tables and a 50mm Z motorized table. A gas-spring slide allows adjusting of the height clearance to up to a total of 140mm for varying sample sizes. The microhardness module is capable of both hardness and scratch and wear measurements. The Platform is the ideal option for diverse and expanding measurement needs.

The spectroscopic ellipsometer is used to characterize surfaces and thin films.  Ellipsometry is a non contact, non destructive optical method that functions by measuring the change in polarization state of light reflected from a sample. Modeling the change in polarization yields film thickness, surface roughness and optical properties.

  • Ocean Optics USB 4000 Fiberoptic UV-Vis Spectrophotometer

The USB 4000 is used to measure absorbance and transmission characteristics of liquid and thin film samples from 200 – 850 nm. A variable angle reflection sample system is included in the setup.

  • Horiba Fluorolog 3 Spectrofluorometer with quantum yield accessory

The spectrofluorometer is used to measure both the excitation and emission spectra of photo- luminescent materials. This information is used to investigate the quantum mechanical states of the materials. The quantum yield accessory allows for absolute measurements.


Glovebox integrated Oriel Sol2A solar simulator and Keithley IV station.

The QEX10 is used for external quantum efficiency (EQE) measurements. EQE is also known as the Incident Photon Conversion Efficiency (IPCE) of a solar cell. The EQE measures the current obtained per incoming photon as a function of wavelength. This system is available for measurements inside and outside of the glovebox, and has various accessories, including an integrating sphere for reflectance measurements, and lamps for QE measurements under light bias.

The MM 450M-B is integrated into the glovebox, and available as a general purpose probe station.

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